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ATS
2002
IEEE
14 years 3 months ago
2002
IEEE
As the deep sub-micron techniques evolving, embedded memories are dominating the yield, while the testing and measurement issues are more difficult due to the access limitations. ...
DATE
2002
IEEE
14 years 3 months ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
DATE
2002
IEEE
14 years 3 months ago
2002
IEEE
To enable fast and accurate evaluation of HW/SW implementation choices of on-chip communication, we present a method to automatically generate timed OS simulation models. The meth...
FGR
2002
IEEE
14 years 3 months ago
2002
IEEE
Robust, real-time, fully automatic tracking of facial features is required for many computer vision and graphics applications. In this paper, we describe a fully automatic system ...
GLVLSI
2002
IEEE
14 years 3 months ago
2002
IEEE
We present a novel test scheduling algorithm for embedded corebased SoC’s. Given a system integrated with a set of cores and a set of test resources, we select a test for each c...