Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simp...
We propose two practical approaches for on-chip inductance extraction to obtain a highly sparsified and accurate inverse inductance matrix K. Both approaches differ from previous ...
Although simulation remains an important part of application-specific integrated circuit (ASIC) validation, hardware-assisted parallel verification is becoming a larger part of the...
The implementation of a microcoded elliptic curve processor using field-programmable gate array technology is described. This processor implements optimal normal basis field operat...
Abstract--Hardward/software (HW/SW) codesign and reconfigurable computing are commonly used methodologies for digitalsystems design. However, no previous work has been carried out ...