240 search results - page 16 / 48 » vlsi 2005 |
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
The electromigration effect within current-density-stressed signal and power lines is an ubiquitous and increasingly important reliability and design problem in sub-micron IC desi...
FCCM
2005
IEEE
14 years 1 months ago
2005
IEEE
We report test results from a prototype asynchronous FPGA (AFPGA) implemented in TSMC’s 0.18μm CMOS process. The AFPGA uses SRAM-based configuration bits with pipelined logic ...
ISVLSI
2005
IEEE
14 years 1 months ago
2005
IEEE
Mesh interconnect can be efficiently utilized while tree networks encourage the short routing distances. In this paper, we present the property analysis of a cluster-based interc...
SBCCI
2005
ACM
14 years 1 months ago
2005
ACM
The physical implementation of cryptographic algorithms may leak to some attacker security information by the side channel data, as power consumption, timing, temperature or elect...
DFT
2005
IEEE
14 years 1 months ago
2005
IEEE
SRAM-based Field Programmable Gate Arrays (FPGAs) are very susceptible to Single Event Upsets (SEUs) that may have dramatic effects on the circuits they implement. In this paper w...