240 search results - page 32 / 48 » vlsi 2005 |
ASAP
2005
IEEE
14 years 1 months ago
2005
IEEE
We studied the dynamic instruction count reduction for a single-thread, vectorized and a multi-threaded, non-vectorized, MPEG-4 video encoder. Results indicate a maximum improveme...
CEC
2005
IEEE
14 years 1 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper, we highlight a fast, effective and practical statistical approach that deals with inter and intra-die variations in VLSI chips. Our methodology is applied to a numb...
DFT
2005
IEEE
14 years 1 months ago
2005
IEEE
As digital imagers grow in pixel count and area, the ability to correct for pixel defects becomes more important. A fault tolerant Active Pixel Sensor (APS) has previously been de...
DFT
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper analyzes the deposition defects in devices and circuits made of Quantum-dot Cellular Automata (QCA) for molecular implementation. Differently from metal-based QCA, in ...