We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
The paper presents two new approaches to multiobjective design space exploration for parametric VLSI systems. Both considerably reduce the number of simulations needed to determin...
The radiation and surface wave losses may give rise to electromagnetic interference (EMI) problems in high speed VLSI interconnects. Over and above there will be dielectric and co...
As a basic cell of arithmetic circuits, a one-bit full adder and a counter are usually used. Minimizing power consumption of these components is a key issue for low-power circuit ...
This paper presents the applicability of a cosimulation methodology based on an object-oriented simulation environment, to multi-domain and multi-language systems design. This met...