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VLSID
2010
IEEE
13 years 5 months ago
2010
IEEE
Due to the inherent nature of heat flow in 3D integrated circuits, stacked dies exhibit a wide range of thermal characteristics. The strong dependence of leakage with temperature...
VLSID
2010
IEEE
13 years 5 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
VLSID
2010
IEEE
13 years 11 months ago
2010
IEEE
Network-on-Chip combined with Globally Asynchronous Locally Synchronous paradigm is a promising architecture for easy IP integration and utilization with multiple voltage levels. ...