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MTV
2005
IEEE
138views Hardware» more  MTV 2005»
14 years 1 months ago
Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
Paolo Bernardi, Ernesto Sánchez, Massimilia...
MICRO
2002
IEEE
111views Hardware» more  MICRO 2002»
14 years 19 days ago
Managing static leakage energy in microprocessor functional units
Steve Dropsho, Volkan Kursun, David H. Albonesi, S...
ICASSP
2010
IEEE
13 years 8 months ago
Widely and semi-widely linear processing of quaternion vectors
In this paper the two main definitions of quaternion properness (or second order circularity) are reviewed, showing their connection with the structure of the optimal quaternion ...
Javier Vía, David Ramírez, Ignacio S...