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    ISCAS
    2003
    IEEE
    110views Hardware» more  ISCAS 2003»
    A modular test structure for CMOS mismatch characterization
    14 years 6 months ago
    A modular test structure for CMOS mismatch characterization
    Download  www.deit.univpm.it
    In this work a new test structure for mismatch characterization of CMOS technologies is presented. The test structure is modular, with a reduced area and it can be inserted in the...
    Massimo Conti, Paolo Crippa, Francesco Fedecostunt...
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