DSN
2008
IEEE
14 years 6 months ago
2008
IEEE
Latent sector errors in disk drives affect only a few data sectors. They occur silently and are detected only when the affected area is accessed again. If a latent error is detect...
DSN
2008
IEEE
14 years 6 months ago
2008
IEEE
Many classes of applications are inherently tolerant to errors. One such class are applications designed for a human end user, where the capabilities of the human cognitive system...
DSN
2008
IEEE
14 years 6 months ago
2008
IEEE
Many threats that plague today’s networks (e.g., phishing, botnets, denial of service attacks) are enabled by a complex ecosystem of attack programs commonly called malware. To ...
DSN
2008
IEEE
14 years 6 months ago
2008
IEEE
Many emerging distributed applications require the realtime processing of large amounts of data that are being updated continuously. Distributed stream processing systems offer a ...
DSN
2008
IEEE
14 years 6 months ago
2008
IEEE
As a network evolves over time, multiple operators modify its configuration, without fully considering what has previously been done. Similar policies are defined more than once, ...
DSN
2008
IEEE
14 years 6 months ago
2008
IEEE
A method for Statistical Fault Injection (SFI) into arbitrary latches within a full system hardware-emulated model is validated against particle-beam-accelerated SER testing for a...
DSN
2008
IEEE
14 years 6 months ago
2008
IEEE
In the near future, hardware is expected to become increasingly vulnerable to faults due to continuously decreasing feature size. Software-level symptoms have previously been used...
DSN
2008
IEEE
14 years 6 months ago
2008
IEEE
In this work, we characterize a significant source of software derating that we call instruction-level derating. Instruction-level derating encompasses the mechanisms by which co...
DSN
2008
IEEE
14 years 6 months ago
2008
IEEE
Conventional processor fault tolerance based on time/space redundancy is robust but prohibitively expensive for commodity processors. This paper explores an unconventional approac...
DSN
2008
IEEE
14 years 6 months ago
2008
IEEE
The last few years have witnessed an unprecedented explosion in transistor densities. Diminutive feature sizes have enabled microprocessor designers to break the billion-transisto...