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ICCAD
2003
IEEE
105views Hardware» more  ICCAD 2003»
14 years 9 months ago
TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers
We present a new approach for TAM optimization and test scheduling in the modular testing of mixed-signal SOCs. A test planning approach for digital SOCs is extended to handle ana...
Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty