ASPDAC
2009
ACM
14 years 6 months ago
2009
ACM
Abstract— In an effort to make processors more power efficient scratch pad memory (SPM) have been proposed instead of caches, which can consume majority of processor power. Howe...
ASPDAC
2009
ACM
14 years 6 months ago
2009
ACM
In response to the increasing variations in integrated-circuit manufacturing, the current trend is to create designs that take these variations into account statistically. In this...
ASPDAC
2009
ACM
14 years 6 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
ASPDAC
2009
ACM
14 years 6 months ago
2009
ACM
ASPDAC
2009
ACM
14 years 6 months ago
2009
ACM
Majority of practical multivariate statistical analyses and optimizations model interdependence among random variables in terms of the linear correlation among them. Though linear...
ASPDAC
2009
ACM
14 years 6 months ago
2009
ACM
— Recent advances in statistical timing analysis (SSTA) achieve great success in computing arrival times under variations by extending sum and maximum operations to random variab...
ASPDAC
2009
ACM
14 years 6 months ago
2009
ACM
— To address the performance limitation brought by the scaling issues of on-chip global wires, a new configuration for global wiring using on-chip lossy transmission lines is pr...
ASPDAC
2009
ACM
14 years 6 months ago
2009
ACM
ASPDAC
2009
ACM
14 years 6 months ago
2009
ACM
ASPDAC
2009
ACM
14 years 6 months ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a major reliability concern in present-day digital circuit design. Further, with the recent usage of...