ICRA
2005
IEEE
14 years 5 months ago
2005
IEEE
Abstract— Nanomanipulation using Atomic Force Microscope (AFM) has been extensively investigated for many years. However, control of tip position during nanomanipulation is still...
HAPTICS
2008
IEEE
14 years 6 months ago
2008
IEEE
Abstract. This paper introduces a new pedagogical tool using haptic feedback and visual analogy, to improve perception and learning of nanoscale phenomena, for people without prior...