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ATS
1996
IEEE
93views Hardware» more  ATS 1996»
14 years 3 months ago
Testable Design and Testing of MCMs Based on Multifrequency Scan
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
Wang-Dauh Tseng, Kuochen Wang
ATS
1996
IEEE
117views Hardware» more  ATS 1996»
14 years 3 months ago
Hierarchical Test Generation with Built-In Fault Diagnosis
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
Dirk Stroobandt, Jan Van Campenhout