This paper considers two types of n-bit adders, ripple carry adders and cascaded carry look-ahead adders, with minimum tests for stuck-at fault models. In the first part, we prese...
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
This paper considers the testability implications of low power design methodologies. Low power and high testability are shown to be highly contrasting requirements, and an optimiz...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto, Mau...