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32

ATS
1997
IEEE

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Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits

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Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits

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Josep Altet, Antonio Rubio, Hideo Tamamoto

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Added	05 Aug 2010
Updated	05 Aug 2010
Type	Conference
Year	1997
Where	ATS
Authors	Josep Altet, Antonio Rubio, Hideo Tamamoto

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