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    ATS
    1997
    IEEE
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    Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits

    14 years 4 months ago
    Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits
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    Josep Altet, Antonio Rubio, Hideo Tamamoto
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    Added 05 Aug 2010
    Updated 05 Aug 2010
    Type Conference
    Year 1997
    Where ATS
    Authors Josep Altet, Antonio Rubio, Hideo Tamamoto
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