Since Field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily toleruted once fault sites are located. Previous researches on diagnosis of FPGAs mai...
A current sensing device, namely Hall Effect MOSFET (HEMOS) is proposed. It is experimentally shown that the HEMOS enables a non-contacting, and non-disturbing current measurement...
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
Madhavi Karkala, Nur A. Touba, Hans-Joachim Wunder...
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
This paper presents the design and simulation method for developing a RISC-based 32-bit embedded on-board computer. Instead of the conventional breadboarded prototype, (1) we used...
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...