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DATE
2006
IEEE
114
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DATE 2006
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A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap
14 years 6 months ago
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Built-in self-repair (BISR) technique is gaining popular for repairing embedded memory cores in system-onchips (SOCs). To increase the utilization of memory redundancy, the BISR t...
Tsu-Wei Tseng, Jin-Fu Li, Da-Ming Chang
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