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    DATE
    2006
    IEEE
    114views Hardware» more  DATE 2006»
    A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap
    14 years 5 months ago
    A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap
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    Built-in self-repair (BISR) technique is gaining popular for repairing embedded memory cores in system-onchips (SOCs). To increase the utilization of memory redundancy, the BISR t...
    Tsu-Wei Tseng, Jin-Fu Li, Da-Ming Chang
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