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ASPDAC
2001
ACM
104views Hardware» more  ASPDAC 2001»
14 years 4 months ago
Processor-programmable memory BIST for bus-connected embedded memories
Abstract--We present a processor-programmable built-in selftest (BIST) scheme suitable for embedded memory testing in the system-on-a-chip (SOC) environment. The proposed BIST circ...
Ching-Hong Tsai, Cheng-Wen Wu
ICCAD
1997
IEEE
106views Hardware» more  ICCAD 1997»
14 years 4 months ago
BIST TPG for faults in system backplanes
A built-in self-test (BIST) methodology to test system backplanes by using BIST functionality in each of its constituent boards is presented. Since the configurations of systems ...
Chen-Huan Chiang, Sandeep K. Gupta