ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
A deterministic BIST scheme is presented which requires less hardware overhead than pseudo-random BIST but obtains better or even complete fault coverage at the same time. It take...
VTS
2005
IEEE
14 years 12 days ago
2005
IEEE
This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...