Sciweavers

DFT
2003
IEEE
100views VLSI» more  DFT 2003»
14 years 5 months ago
Scan-Based BIST Diagnosis Using an Embedded Processor
For system-on-chip designs that contain an embedded processor, this paper present a software based diagnosis scheme that can make use of the processor to aid in diagnosis in a sca...
Kedarnath J. Balakrishnan, Nur A. Touba