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ICCAD
1994
IEEE
83views Hardware» more  ICCAD 1994»
14 years 4 months ago
A new built-in self-test approach for digital-to-analog and analog-to-digital converters
This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity...
Karim Arabi, Bozena Kaminska, Janusz Rzeszut