ICCD
1997
IEEE
14 years 3 months ago
1997
IEEE
: This paper studies pseudo-random pattern testing of bridging faults. Although bridging faults are generally more random pattern testable than stuck-at faults, examples are shown ...
DATE
2003
IEEE
14 years 4 months ago
2003
IEEE
We investigate a characterization of hard-to-detect bridging faults. For circuits with large numbers of lines (or nodes), this characterization can be used to select target faults...
DDECS
2007
IEEE
14 years 5 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...