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ITC
2003
IEEE
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14 years 28 days ago
Burn-in Temperature Projections for Deep Sub-micron Technologies
Burn-in faces significant challenges in recent CMOS technologies. The self-generated heat of each IC in a burn-in environment contributes to larger currents that can lead to furth...
Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali K...