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    ISVLSI
    2008
    IEEE
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    Cache Power Reduction in Presence of Within-Die Delay Variation Using Spare Ways
    14 years 7 months ago
    Cache Power Reduction in Presence of Within-Die Delay Variation Using Spare Ways
    Download  qir.kyushu-u.ac.jp
    The share of leakage in cache power consumption increases with technology scaling. Choosing a higher threshold voltage (Vth) and/or gate-oxide thickness (Tox) for cache transistor...
    Maziar Goudarzi, Tadayuki Matsumura, Tohru Ishihar...
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