ATS
2003
IEEE
14 years 5 months ago
2003
IEEE
: Most of the recently discussed test stimulus data compression techniques are based on the low care bit densities found in typical scan test vectors. Data reduction primarily is a...
ICCD
2003
IEEE
14 years 9 months ago
2003
IEEE
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...