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DATE
2008
IEEE
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DATE 2008
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CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns
14 years 2 months ago
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CASP, Concurrent Autonomous chip self-test using Stored test Patterns, is a special kind of self-test where a system tests itself concurrently during normal operation without any ...
Yanjing Li, Samy Makar, Subhasish Mitra
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