This paper proposes a 0.5V / 100MHz / sub-5mW-operated 1-Mbit SRAM cell architecture which uses an overVCC grounded data storage (OVGS) scheme. The key target of OVGS is to minimi...
A delay-locked loop (DLL) based built-in self test (BIST) circuit has been designed with a 0.18 µ m TSMC process (CM018) to test chip I/O speeds, specifically, the setup and hold...