We present a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices ac...
Christian J. Hescott, Drew C. Ness, David J. Lilja
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...