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ISQED
2007
IEEE
116views Hardware» more  ISQED 2007»
14 years 5 months ago
MEMESTAR: A Simulation Framework for Reliability Evaluation over Multiple Environments
We present a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices ac...
Christian J. Hescott, Drew C. Ness, David J. Lilja
ISQED
2007
IEEE
135views Hardware» more  ISQED 2007»
14 years 5 months ago
MARS-S: Modeling and Reduction of Soft Errors in Sequential Circuits
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
Natasa Miskov-Zivanov, Diana Marculescu
DAC
2009
ACM
15 years 5 days ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...