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ISQED
2007
IEEE
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ISQED 2007
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Defect or Variation? Characterizing Standard Cell Behavior at 90nm and below
14 years 5 months ago
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infocenter.arm.com
Historically, design margin and defects have been viewed as different topics, one part of design and the other part of test. Shrinking process geometries are making the two part o...
Robert C. Aitken
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