ICCAD
2002
IEEE
14 years 12 months ago
2002
IEEE
We present a new method of built-in-self-test (BIST) for sequential circuits and system-on-a-chip (SOC) using characteristic faults and circuitspecific spectral information in th...
ICCD
2003
IEEE
14 years 12 months ago
2003
IEEE
We discuss the compaction of independent test sequences for sequential circuits. Our first contribution is the formulation of this problem as an integer program, which we then so...