VLSID
2008
IEEE
15 years 1 months ago
2008
IEEE
Today's customizable processors allow the designer to augment the base processor with custom accelerators. By choosing appropriate set of accelerators, designer can significa...
VLSID
2008
IEEE
15 years 1 months ago
2008
IEEE
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...
VLSID
2008
IEEE
15 years 1 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
VLSID
2008
IEEE
15 years 1 months ago
2008
IEEE
Protocol conversion involves the use of a converter to control communication between two or more protocols such that desired system-level specifications can be satisfied. We invest...
VLSID
2008
IEEE
15 years 1 months ago
2008
IEEE
Technology scaling has resulted in an exponential increase in the leakage power as well as the variations in leakage power of fabricated chips. Functional units (FUs), like Intege...
VLSID
2008
IEEE
15 years 1 months ago
2008
IEEE
Worst-case execution time (WCET) analysis and, in general, the predictability of real-time applications implemented on multiprocessor systems has been addressed only in very restri...
VLSID
2008
IEEE
15 years 1 months ago
2008
IEEE
In the automatic design of custom instruction set processors, there can be a very large set of potential custom instructions, from which a few instructions are required to be chos...
VLSID
2008
IEEE
15 years 1 months ago
2008
IEEE
Power consumption, physical size, and architecture design of sensor node processors have been the focus of sensor network research in the architecture community. What lies at the ...
VLSID
2008
IEEE
15 years 1 months ago
2008
IEEE
This paper demonstrates a formal verificationplanning process and presents associated verification strategy that we believe is an essential (yet often neglected) step in an ASIC o...
VLSID
2008
IEEE
15 years 1 months ago
2008
IEEE
Abstract-- With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation systems. Technology trends su...