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96
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VTS
2008
IEEE
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VTS 2008
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A Statistical Approach to Characterizing and Testing Functionalized Nanowires
15 years 9 months ago
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www.eng.yale.edu
Unlike the top-down photolithographic CMOS VLSI process, cost-effective bulk fabrication of nanodevices calls for a bottom-up approach, generally called self-assembly. Selfassembl...
James Dardig, Haralampos-G. D. Stratigopoulos, Eri...
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