ISPD
2000
ACM
13 years 11 months ago
2000
ACM
We address the problem of computing critical area for missing material defects in a circuit layout. The extraction of critical area is the main computational problem in VLSI yield...
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
This paper presents a new compaction algorithm to improve the yield of IC layout. The yield is improved by reducing the area where the faults are more likely to happen known as cr...