ISPD
2000
ACM
14 years 5 months ago
2000
ACM
We address the problem of computing critical area for missing material defects in a circuit layout. The extraction of critical area is the main computational problem in VLSI yield...
DATE
2000
IEEE
14 years 5 months ago
2000
IEEE
This paper presents a new compaction algorithm to improve the yield of IC layout. The yield is improved by reducing the area where the faults are more likely to happen known as cr...