VTS
2003
IEEE
14 years 5 months ago
2003
IEEE
— In this paper, we study the problem of delay defect diagnosis based on statistical timing models. We propose a diagnosis algorithm that can effectively utilize statistical timi...
DATE
2003
IEEE
14 years 5 months ago
2003
IEEE
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...