VTS
2008
IEEE
14 years 6 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...