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DAC
2005
ACM
13 years 8 months ago
Mapping statistical process variations toward circuit performance variability: an analytical modeling approach
A physical yet compact gate delay model is developed integrating short-channel effects and the Alpha-power law based timing model. This analytical approach accurately predicts bot...
Yu Cao, Lawrence T. Clark
FPGA
2007
ACM
142views FPGA» more  FPGA 2007»
14 years 1 months ago
Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
N. Pete Sedcole, Peter Y. K. Cheung