SAC
2008
ACM
13 years 7 months ago
2008
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed testing of high-speed embedded processors testing in an SoC system. For SBST, test rout...
ITC
2000
IEEE
13 years 11 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
DFT
2003
IEEE
14 years 23 days ago
2003
IEEE
1 This paper presents a solution to the test time minimization problem for core-based systems that contain sequential cores with STUMPS architecture. We assume a hybrid BIST approa...