TCAD
1998
13 years 11 months ago
1998
—We study the effect of the controller on the testability of sequential circuits composed of controllers and data paths. We show that even when all the loops of the circuit have ...
VLSID
2004
IEEE
14 years 12 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...