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ITC
2003
IEEE
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ITC 2003
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Defect Tolerance at the End of the Roadmap
14 years 1 months ago
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www-2.cs.cmu.edu
Defect tolerance will become more important as feature sizes shrink closer to single digit nanometer dimensions. This is true whether the chips are manufactured using topdown meth...
Mahim Mishra, Seth Copen Goldstein
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