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DFT
2003
IEEE

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Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits

14 years 4 months ago

Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...

Atul Maheshwari, Israel Koren, Wayne Burleson

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