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    DFT
    2003
    IEEE
    106views VLSI» more  DFT 2003»
    Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits
    14 years 8 months ago
    Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits
    Download  euler.ecs.umass.edu
    Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...
    Atul Maheshwari, Israel Koren, Wayne Burleson
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