TCAD
2010
13 years 7 months ago
2010
Abstract--This paper presents a technology mapping algorithm for field-programmable gate array architectures with dual supply voltages (Vdds) for power optimization. This is done w...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...