Sciweavers

VTS
2002
IEEE
113views Hardware» more  VTS 2002»
14 years 4 months ago
Testing Static and Dynamic Faults in Random Access Memories
The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored an...
Said Hamdioui, Zaid Al-Ars, A. J. van de Goor
ETS
2007
IEEE
91views Hardware» more  ETS 2007»
14 years 5 months ago
PPM Reduction on Embedded Memories in System on Chip
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...
Said Hamdioui, Zaid Al-Ars, Javier Jiménez,...