Testing Static and Dynamic Faults in Random Access Memories

The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored any more. It will be shown in this paper that conventional memory tests constructed to detect the static faulty behavior of a specific defect do not necessarily detect its dynamic faulty behavior; which has been shown to exist. The dynamic fault behavior can take place in the absence of the static fault behavior. The paper therefore also presents new memory tests derived to target the dynamic fault class. Key words: static faults, dynamic faults, fault primitives, memory tests, fault coverage.

• Type: Conference
• Year: 2002
• Where: VTS
• Authors: Said Hamdioui, Zaid Al-Ars, A. J. van de Goor
• Keywords: Dynamic Faults, Fault Coverage, Static Faults, VLSI, VTS 2002