ERSA
2006
14 years 29 days ago
2006
CSREAESA
2008
14 years 1 months ago
2008
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
DAC
2000
ACM
15 years 16 days ago
2000
ACM
A major challenge in realizing core-based system chips is the adoption and design-in of adequate test and diagnosis strategies. This tutorial paper discusses the specific challeng...