Sciweavers

DFT
2003
IEEE
79views VLSI» more  DFT 2003»
14 years 4 months ago
Partial Error Masking to Reduce Soft Error Failure Rate in Logic Circuits
A new methodology for designing logic circuits with partial error masking is described. The key idea is to exploit the asymmetric soft error susceptibility of nodes in a logic cir...
Kartik Mohanram, Nur A. Touba