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ET
2002
77views more  ET 2002»
13 years 11 months ago
Reusing Scan Chains for Test Pattern Decompression
The paper presents a method for testing a system-on-achip by using a compressed representation of the patterns on an external tester. The patterns for a certain core under test ar...
Rainer Dorsch, Hans-Joachim Wunderlich
VTS
2007
IEEE
103views Hardware» more  VTS 2007»
14 years 5 months ago
At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
Matthieu Tuna, Mounir Benabdenbi, Alain Greiner