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GLVLSI
1999
IEEE
92views VLSI» more  GLVLSI 1999»
14 years 3 months ago
Fault Coverage Estimation for Early Stage of VLSI Design
This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...
Von-Kyoung Kim, Tom Chen, Mick Tegethoff
ICCAD
2000
IEEE
77views Hardware» more  ICCAD 2000»
14 years 3 months ago
Improving the Proportion of At-Speed Tests in Scan BIST
A method to select the lengths of functional sequences in a BIST scheme for scan designs is proposed in this paper. A functional sequence is a sequence of primary input vectors ap...
Yu Huang, Irith Pomeranz, Sudhakar M. Reddy, Janus...