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DATE
2000
IEEE
90views Hardware» more  DATE 2000»
14 years 4 months ago
Cost Reduction and Evaluation of a Temporary Faults Detecting Technique
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
Lorena Anghel, Michael Nicolaidis
ICCD
2003
IEEE
143views Hardware» more  ICCD 2003»
14 years 8 months ago
Cost-Effective Graceful Degradation in Speculative Processor Subsystems: The Branch Prediction Case
We analyze the effect of errors in branch predictors, a representative example of speculative processor subsystems, to motivate the necessity for fault tolerance in such subsystem...
Sobeeh Almukhaizim, Thomas Verdel, Yiorgos Makris