PDP
2010
IEEE
13 years 9 months ago
2010
IEEE
— This paper presents Investigation of Transient Fault Effects in an asynchronous NoC router. The experiment is based on simulation-based fault injection method to assess the fau...
MIDDLEWARE
2010
Springer
13 years 10 months ago
2010
Springer
Distributed hash tables (DHTs) have been adopted as a building block for large-scale distributed systems. The upshot of this success is that their robust operation is even more imp...
ISSRE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Coupling in software applications is often used as an indicator of external quality attributes such as fault-proneness. In fact, the correlation of coupling metrics and faults i...
DSD
2010
IEEE
13 years 10 months ago
2010
IEEE
— A method how to improve the coverage of single faults in combinational circuits is proposed. The method is based on Concurrent Error Detection, but uses a fault simulation to f...
ET
2008
13 years 11 months ago
2008
Processor cores embedded in systems-on-a-chip (SoCs) are often deployed in critical computations, and when affected by faults they may produce dramatic effects. When hardware harde...
TSE
1998
13 years 11 months ago
1998
An important step in the development of dependable systems is the validation of their fault tolerance properties. Fault injection has been widely used for this purpose, however wi...
JISE
2000
13 years 11 months ago
2000
We present an algorithm for identifyinga set of faults that do not have to be targeted by a sequential delay fault test generator. These faults either cannot independently aect th...
TCAD
2008
13 years 11 months ago
2008
Safety-critical feedback-control applications may suffer faults in the controlled plant as well as in the execution platform, i.e., the controller. Control theorists design the con...
FGCS
2007
13 years 11 months ago
2007
One of the topics of paramount importance in the development of Grid middleware is the impact of faults, since their probability of occurrence in a Grid infrastructure and in larg...
ET
2007
13 years 11 months ago
2007
We propose a built-in self-test (BIST) procedure for nanofabrics implemented using chemically assembled electronic nanotechnology. Several fault detection configurations are prese...